Characterization of Nanographite Films by Specular Gloss Measurements

Here we propose and demonstrate a specular gloss-based method to estimate a thickness of nanographite films. The proposed method is used to measure a thicknesses of multilayered graphene material produced by two different chemical vapor deposition processes (CVD). Since the presented technique is non-contact and non-destructive it opens an interesting prospect for the fast assessment of ultrathin nanographite films. The obtained results indicated that the measurement technique can be used to define a thickness of graphite films in accuracy of 3 or 4 graphene layers. Moreover the proposed technique allows us to observe a qualitative difference between plasma-enhanced CVD and thermal CVD.