Enhanced Hole Extraction of WOx/V2Ox Dopant-Free Contact for p-type Silicon Solar Cell

被引:12
|
作者
Liu, Zongtao [1 ,2 ]
Lin, Wenjie [3 ]
Chen, Zhiming [4 ]
Chen, Daming [2 ]
Chen, Yifeng [2 ]
Shen, Hui [1 ]
Liang, Zongcun [1 ]
机构
[1] Sun Yat Sen Univ, Sch Phys, Inst Solar Energy Syst, Guangzhou 510006, Peoples R China
[2] Trina Solar, State Key Lab PV Sci & Technol, Changzhou 213031, Peoples R China
[3] Aikosolar, Global Photovolta Joint Innovat Ctr, Yiwu 322009, Peoples R China
[4] Foshan Raynova Mat Technol Co LTD, Foshan 528000, Peoples R China
基金
中国国家自然科学基金;
关键词
dopant-free solar cells; hole-selective contacts; silicon solar cells; transition metal oxides; SELECTIVE CONTACTS; TUNGSTEN-OXIDE; PASSIVATED CONTACTS; SURFACE REDUCTION; WORK FUNCTION; MOLYBDENUM; EFFICIENCY; CENTERS; SYSTEM; STATE;
D O I
10.1002/admi.202102374
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nonstoichiometric vanadium oxide V2Ox has been demonstrated to serve as a hole-selective contact in crystalline silicon solar cells. A reaction between V2Ox deposited by thermal evaporation and silicon can, however, result in a decreased work function (WF) and reduce hole selectivity. A straightforward and workable solution is presented in this study, which partially restores the WF of V2Ox as deposited on silicon and improving solar cell efficiency, avoiding the use of amorphous silicon. Incorporating WOx into the Ag/V2Ox1/Si structure, to form Ag/WOx/V2Ox2/Si, x(1)<x(2), the WF determined by nonstoichiometric ratio, i.e., x, of V2Ox increases, enhancing the field passivation effect and reducing the rear recombination, which leads to a 11 mV increase in open-circuit voltage and a 0.90 mA cm(-2) increase in short-circuit current. Finally, the solar cell gains an absolute improvement of approximate to 1.0% in power conversion efficiency.
引用
收藏
页数:10
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