Testing techniques for embedded memories in ASIC

被引：0
|
作者：
Jin, LD
机构：
来源：
1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS | 1996年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper provides a survey of four practical testing techniques for embedded memories in ASIC in industry. The pros and cons of these techniques are studied in terms of area, timing, power, pin count, automation, test speed, test quality and chip testing.
引用
收藏
页码：376 / 379
页数：4
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