Derivation of threshold voltage and drain current for cylindrical MOSFET and application to a recessed MOSFET

被引:1
|
作者
Ananthan, Venkat [1 ]
Yang, Rongsheng [1 ]
Mouli, Chandra [1 ]
机构
[1] Proc R&D Micron Technol, Boise, ID 83716 USA
关键词
cylindrical MOSFET; threshold voltage; recessed gate MOSFET;
D O I
10.1109/WMED.2008.4510655
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Threshold voltage and drive current for a cylindrical MOSFET have been rigorously derived for the first time. An approximate expression for these quantities is presented for the purpose of analytical calculations. The model has been verified against TCAD simulations. The characteristics of a recessed gate MOSFET is analysed using these models.
引用
收藏
页码:9 / 11
页数:3
相关论文
共 50 条
  • [1] Analytical modelling of threshold voltage and drain current in short channel fully depleted cylindrical gate MOSFET
    Gupta, PS
    Kranti, A
    Haldar, S
    PROCEEDING OF THE TENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOLS I AND II, 2000, 3975 : 475 - 482
  • [2] The threshold voltage of SiC Schottky barrier source/drain MOSFET
    Tang Xiao-Yan
    Zhang Yi-Men
    Zhang Yu-Ming
    ACTA PHYSICA SINICA, 2009, 58 (01) : 494 - 497
  • [3] MOSFET DRAIN BREAKDOWN VOLTAGE
    FENG, WS
    CHAN, TY
    HU, CM
    IEEE ELECTRON DEVICE LETTERS, 1986, 7 (07) : 449 - 450
  • [4] DRAIN-VOLTAGE EFFECTS ON THE THRESHOLD VOLTAGE OF A SMALL-GEOMETRY MOSFET
    CHAO, CS
    AKERS, LA
    PATTANAYAK, DN
    SOLID-STATE ELECTRONICS, 1983, 26 (09) : 851 - 860
  • [5] Analytical threshold voltage model for cylindrical surrounding-gate MOSFET with electrically induced source/drain extensions
    Li, Cong
    Zhuang, Yiqi
    Han, Ru
    Jin, Gang
    Bao, Junlin
    MICROELECTRONICS RELIABILITY, 2011, 51 (12) : 2053 - 2058
  • [6] Modeling of the effect of uniaxial mechanical strain on drain current and threshold voltage of an n-type MOSFET
    Chaudhry, Amit
    Sangwan, Sonu
    SOLID-STATE ELECTRONICS, 2013, 79 : 133 - 137
  • [7] Threshold voltage model of a double-gate MOSFET with Schottky source and drain
    Xu, Bojuan
    Du, Gang
    Xia, Zhiliang
    Zeng, Lang
    Han, Ruqi
    Liu, Xiaoyan
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2007, 28 (08): : 1179 - 1183
  • [8] Measurement of the MOSFET drain current variation under high gate voltage
    Chagawa, Tetsuo
    Terada, Kazuo
    Xiang, Jianyu
    Tsuji, Katsuhiro
    Tsunomura, Takaaki
    Nishida, Akio
    2008 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, CONFERENCE PROCEEDINGS, 2008, : 86 - +
  • [9] Measurement of the MOSFET drain current variation under high gate voltage
    Terada, Kazuo
    Chagawa, Tetsuo
    Xiang, Jianyu
    Tsuji, Katsuhiro
    Tsunomura, Takaaki
    Nishida, Akio
    SOLID-STATE ELECTRONICS, 2009, 53 (03) : 314 - 319
  • [10] Generalized Constant Current Method for Determining MOSFET Threshold Voltage
    Bucher, Matthias
    Makris, Nikolaos
    Chevas, Loukas
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (11) : 4559 - 4562