Graphene field-effect transistors based on boron nitride gate dielectrics

被引:0
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作者
Meric, Inanc [1 ]
Dean, Cory [1 ,3 ]
Young, Andrea [2 ]
Hone, Jim [3 ]
Kim, Philip [2 ]
Shepard, Kenneth L. [1 ]
机构
[1] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[2] Columbia Univ, Dept Phys, New York, NY 10027 USA
[3] Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Graphene field-effect transistors are fabricated utilizing single-crystal hexagonal boron nitride (h-BN), an insulating isomorph of graphene, as the gate dielectric. The devices exhibit mobility values exceeding 10,000 cm(2)/V-sec and current saturation down to 500 nm channel lengths with intrinsic transconductance values above 400 mS/mm. The work demonstrates the favorable properties of using h-BNas a gate dielectric for graphene FETs.
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页数:4
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