Computational study on polymer filling process in nanoimprint lithography

被引:27
|
作者
Yasuda, Masaaki [1 ]
Araki, Kosei
Taga, Akihiro
Horiba, Akira
Kawata, Hiroaki
Hirai, Yoshihiko
机构
[1] Osaka Prefecture Univ, Dept Phys & Elect, Osaka 5998531, Japan
关键词
Nanoimprint; Molecular dynamics; Polymer; Pattern geometry; IMPRINT LITHOGRAPHY; MOLECULAR-DYNAMICS; DEFORMATION; SIMULATION; STRESS;
D O I
10.1016/j.mee.2011.01.016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The pattern geometry dependence of the resist-filling process in nanoimprint lithography is studied with molecular dynamics and continuum mechanics simulations. When the cavity size becomes smaller than the molecular size of the polymer, the filling ratio of the cavity becomes quite low in MD simulation. This polymer-size effect is not seen in continuum mechanics. The filling ratio of the cavity decreases with increase in neighboring cavity size. The influence of the cavity size is larger than that of the cavity position in the polymer filling process. We also demonstrate typical examples of the movement of the polymer molecule during the filling process. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2188 / 2191
页数:4
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