Multiwavelength optical fiber refractive index profiling

被引：5
|
作者：
Yablon, Andrew D. [1 ]
机构：
[1] Interfiber Anal, Livingston, NJ 07039 USA
来源：
FIBER LASERS VII: TECHNOLOGY, SYSTEMS, AND APPLICATIONS | 2010年 / 7580卷
关键词：
Refractive index profiling; Fourier transform spectroscopy; optical fiber measurements; INTERFERENCE MICROSCOPY; PHASE TOMOGRAPHY; DISPERSION; INTERFEROMETRY; SILICA;
D O I：
10.1117/12.841883
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Fourier transform spectroscopy and interference microscopy are combined to provide the world's first multi-wavelength optical fiber refractive index profile (RIP) measurements. The RIP and its spectral dependence are obtained with submicron spatial resolution across an octave stretching from about 500 nm to the 1 micron operating band of Yb-doped fiber lasers and amplifiers. In contrast to commercial Refracted Near Field (RNF) technology, which measures at a cleave, the technique described here measures transversely through the side of an uncleaved fiber, enabling measurements of axial fiber RIP variations found in fiber gratings, physical tapers, and fusion splices.
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页数：8
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