Mixed-Signal Boundary Scan Test Bus Controller Design Based on AVR

被引：0

作者：

Chen Shengjian ^{[1
]}

Xu Lei ^{[1
]}

Zhou Yin ^{[1
]}

Wang Jinyang ^{[1
]}

机构：

[1] Acad Armored Forces Engn, Beijing 100072, Peoples R China

来源：

PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1 - 4 | 2010年

关键词：

AVR; boundary scan; test bus controller; mixed-signal printed circuit;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Mixed-signal printed circuit troubleshooting presents an extremely difficult task for many electronics manufacturers. Boundary scan test technology is one of the most efficient test approaches which provides a set of standardized structures to improve the control and observability of printed circuits' nodes. There has been a great surge in research interested in the corresponding test structures and strategies, however, the researches on boundary scan test bus controller are deficiency. Aimed to solve aforementioned problem, an AVR based boundary-scan test bus controller design for mixed-signal printed circuits is proposed. The AVR charges the intercommunion between the test codes and boundary scan signals automatically and makes the fault diagnosis of mixed-signal circuits become more efficient and low cost.

引用

页码：177 / 182

页数：6

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