Mixed-Signal Boundary Scan Test Bus Controller Design Based on AVR

Mixed-signal printed circuit troubleshooting presents an extremely difficult task for many electronics manufacturers. Boundary scan test technology is one of the most efficient test approaches which provides a set of standardized structures to improve the control and observability of printed circuits' nodes. There has been a great surge in research interested in the corresponding test structures and strategies, however, the researches on boundary scan test bus controller are deficiency. Aimed to solve aforementioned problem, an AVR based boundary-scan test bus controller design for mixed-signal printed circuits is proposed. The AVR charges the intercommunion between the test codes and boundary scan signals automatically and makes the fault diagnosis of mixed-signal circuits become more efficient and low cost.