Don't Cares based Dynamic Test Vector Compaction in SAT-ATPG

被引：0

作者：

Habib, Kareem ^{[1
]}

Safar, Mona ^{[2
]}

Dessouky, Mohamed ^{[1
]}

Salem, Ashraf ^{[1
]}

机构：

[1] Mentor Graph Corp, Cairo, Egypt

[2] Ain Shams Univ, Fac Engn, Comp & Syst Engn Dept, Cairo, Egypt

来源：

2014 IEEE 57TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) | 2014年

关键词：

SAT; ATPG; CNF; Dynamic Compaction;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

SAT solvers have been used as ATPG solution due to the advantage of transforming the circuit to a mathematical problem that can quickly be solved rather than using traditional circuit based approach. In this paper, we present a novel technique for dynamically compacting the test vector set in SAT-based ATPG as it searches for individual vectors, hence giving out fewer patterns that cover more faults. Three-valued encoding was used to allow the use of don't cares, a value that is not part of the traditional SAT solver approach. Experimental results compare the traditional approach with the one proposed.

引用

页码：213 / 217

页数：5

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