Bayes analysis;
reliability prediction;
reliability estimates;
test and evaluation;
D O I:
10.1109/RAMS.1999.744111
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Due to declining defense budgets, operational test and evaluation programs for military systems have been downsized. One significant result is less system operational test data. This leads to lower classical confidence inferences on critical measures of performance such as system reliability. This paper explores the use of Bayesian methods to compensate for this decrease in test data by integrating developmental test and evaluation data into the operational test and evaluation phase. Specifically, the reliability of a series system, a parallel system and a classic bridge system are examined over a range of mission times. Components in this study are assumed to have exponential lifetimes. Using simulated data for the three systems, the Bayesian methods produce tighter probability intervals for the system reliability than the confidence intervals found through classical inference methods.
机构:
Harvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USAHarvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USA
Turner, Dana P.
Deng, Hao
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机构:
Harvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USA
Johns Hopkins Univ, Bloomberg Sch Publ Hlth, Baltimore, MD USAHarvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USA
Deng, Hao
Houle, Timothy T.
论文数: 0引用数: 0
h-index: 0
机构:
Harvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USAHarvard Med Sch, Massachusetts Gen Hosp, Dept Anesthesia Crit Care & Pain Med, Boston, MA 02115 USA