Nonactivated transport of ultradilute two-dimensional hole systems in GaAs field-effect transistors: Interaction versus disorder

被引:10
|
作者
Huang, Jian [1 ,2 ]
Pfeiffer, L. N. [2 ]
West, K. W. [2 ]
机构
[1] Wayne State Univ, Dept Phys & Astron, Detroit, MI 48201 USA
[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
基金
美国国家科学基金会;
关键词
METAL-INSULATOR-TRANSITION; COLLOQUIUM;
D O I
10.1103/PhysRevB.85.041304
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Very strongly interacting high-purity two-dimensional (2D) electron systems at temperatures T -> 0 demonstrate certain nonactivated insulating behaviors that are absent in more disordered systems. By measuring in dark the T dependence of the conductivity of ultrahigh-quality 2D holes with charge densities down to 7 x 10(8) cm(-2), an approximate power-law behavior is identified. Moreover, the exponent exhibits a linearly decreasing density dependence which suggests an interaction-driven nature. Such an electron state is fragile to even a slight increase of disorder, which causes a crossover from nonactivated to activated conduction. The nonactivated conduction may well be a universal interaction-driven signature of an electron state of strongly correlated (semiquantum) liquid.
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页数:4
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