共 50 条
- [41] Identification of sub-20 nm EUV defects with Nano-IR PiFM METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI, 2022, 12053
- [43] Fabrication of bowtie aperture antennas for producing sub-20 nm optical spots OPTICS EXPRESS, 2015, 23 (07): : 9093 - 9099
- [44] Simulating Massively Parallel Electron Beam Inspection for sub-20 nm Defects METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIX, 2015, 9424
- [45] Novel CD control of HTPSM by advanced process for sub-20 nm tech PHOTOMASK TECHNOLOGY 2015, 2015, 9635
- [50] Optical volumetric inspection of sub-20 nm patterned defects with wafer noise METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXVIII, 2014, 9050