Steady-State Thermal Modeling of a Power Module: An N-Layer Fourier Approach

被引:17
|
作者
Choudhury, Khaled Redwan [1 ]
Rogers, Daniel J. [1 ]
机构
[1] Univ Oxford, Energy & Power Grp, Oxford OX1 2JD, England
基金
英国工程与自然科学研究理事会;
关键词
Fourier series; power modules; simulation; thermal modeling; verification; SPREADING RESISTANCE;
D O I
10.1109/TPEL.2018.2828439
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The steady-state thermal modeling of a rectangular N-layer structure with an arbitrary number of heat sources on the top surface is obtained by a Fourier series solution. As the structure of power modules can be closely approximated as a rectangular N-layer structure, this model may be used to accurately estimate the temperature field occurring in such modules. Various simplified structures are analyzed to understand the effects of structural approximation on the temperature field. The Fourier-based method developed in this work is compared with the finite-element method simulation, and an excellent matching (approximately 0.27% temperature error) is found in the centers of the semiconductor dies. Experimental temperature measurements taken at the surface of a commercial SiC power module are also presented, demonstrating agreement in the centers of the dies to within 3.5%.
引用
收藏
页码:1500 / 1508
页数:9
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