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High Operating Temperature Quantum-Dot Infrared Photodetector Using Advanced Capping Techniques
被引:6
|作者:
Shao, Jiayi
[1
,2
]
Vandervelde, Thomas E.
[3
,4
]
Jang, Woo-Yong
[1
,2
]
Stintz, Andreas
[1
,2
]
Krishna, Sanjay
[1
,2
]
机构:
[1] Univ New Mexico, Dept Elect & Comp Engn, Albuquerque, NM 87106 USA
[2] Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
[3] Univ New Mexico, Dept Elect & Comp Engn, Albuquerque, NM 87131 USA
[4] Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87131 USA
基金:
美国国家科学基金会;
关键词:
Engineered quantum dots (EQDs);
infrared detectors;
photodetectors quantum dots (QDs);
HIGH-DETECTIVITY;
D O I:
10.1109/TNANO.2010.2096231
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We demonstrate an improvement in the operating temperature of a quantum dot-in-a-well (DWELL)-based infrared photodetector with spectral response observable till 250 K. This improvement was achieved through engineering the dot geometry and the quantum confinement via postgrowth capping of the quantum dots (QDs) by selecting overlying materials under various growth conditions. The effect of the capping procedures was determined by examining the optical properties of the QDs. These were then introduced into the active region of a DWELL IR photodetector. Using this approach, the dark current density is as low as 6.3 x 10(-7) A/cm(2) (V-b = 7 V) at 77 K; the highest operating temperature is increased to 250 K with the lambda(p) = 3.2 mu m. The peak detectivity is found to be 1 x 10(9) cm.Hz(1/2)/W at 77 K and 7.2 x 10(7) cm.Hz(1/2)/W at 250 K.
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页码:1010 / 1014
页数:5
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