Power cycling tests under driving ΔTj=125 °C on the Cu clip bonded EV power module

被引:8
|
作者
Kim, Dongjin [1 ]
Lee, Byeongsoo [1 ]
Lee, Tae-Ik [1 ]
Noh, Seungjun [2 ]
Choe, Chanyang [2 ]
Park, Semin [2 ]
Kim, Min-Su [1 ]
机构
[1] Korea Inst Ind Technol, Adv Joining & Addit Mfg R&D Dept, 156 Gaetbeol ro, Incheon 21999, South Korea
[2] Hyundai Mobis Co Ltd, Power Semicond Module Dev Cell, 17-2 Mabuk ro 240beon gil, Yongin 16891, Gyeonggi Do, South Korea
关键词
Cu clip bonding; Transfer-molded power module; Power cycle; Thermal resistance; Reliability; ALUMINUM WIRE; IGBT MODULES; SINTERED AG; RELIABILITY;
D O I
10.1016/j.microrel.2022.114652
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study investigated the power cycling performance on a transfer-molded power module with Cu clip bonding for the next-generation green automotive applications. A 700 V/900A class 2-in-1 half bridge power module was designed and fabricated by using Cu clip bonding and transfer-molding technologies. The switching was precisely controlled so that ton was 0.5 s and toff was 4.5 s by a constant current mode. The condition of the power cycling tests (PCTs) was Delta T = 125 degrees C with the maximum repetition of 97,000 cycles. The performance and life of the power module was evaluated based on AQG-324, and thermal resistance of the junction (Rth-ja) was monitored during PCTs. The major failure in this investigation was increase in the thermal resistance (Rth). Microstructural integrity of the interconnections were characterized in detail by scanning acoustic tomography (SAT) and interfacial microstructure analysis using a scanning electron microscopy (SEM). The degradation mechanism of the interfacial material was numerically revealed through finite element method (FEM) simulations.
引用
收藏
页数:8
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