Magnetoresistance behavior of single castellated Ni80Fe20 nanowires

被引:21
|
作者
Adeyeye, AO
White, RL
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Informat Storage Mat Lab, Singapore 117576, Singapore
[2] Stanford Univ, Dept Mat Sci & Engn, Stanford Ctr Res Informat Storage Mat, Stanford, CA 94305 USA
关键词
Computer simulation - Electric contacts - Electron beam lithography - Magnetic anisotropy - Magnetic fields - Magnetic variables measurement - Magnetization - Magnetoresistance - Nickel alloys - Optical Kerr effect - Scanning electron microscopy - Temperature;
D O I
10.1063/1.1637726
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied in a systematic way the magnetization reversal processes of single castellated Ni80Fe20 nanowires fabricated by advanced electron beam lithography. The structures consist of two 5 mum wide Ni80Fe20 support wires bridged with a castellated nanowire of width in the range from 80 to 150 nm. We have used the anisotropic magnetoresistance (AMR) effect as a probe of the spin orientations and hence magnetization reversal processes in these complex magnetic structures. When the applied fields are along the horizontal legs of the castellated nanowire, we observe a unique MR response due to the creation of magnetic local easy and hard axes resulting in a number of discontinuous jumps in the magnetoresistance. The magnetoresistance behavior is strongly influenced by spin states at corners of the nanowire for field applied parallel or perpendicular to horizontal legs. These results are in agreement with simple micromagnetic simulations. (C) 2004 American Institute of Physics.
引用
收藏
页码:2025 / 2028
页数:4
相关论文
共 50 条
  • [41] Fourier analysis of exchange biased Ni80Fe20/Fe50Mn50/Ni80Fe20 trilayers
    Maat, S
    Shen, L
    Mankey, GJ
    PHYSICAL REVIEW B, 1999, 60 (14): : 10252 - 10258
  • [42] CORRELATION BETWEEN GIANT MAGNETORESISTANCE AND THE MICROSTRUCTURE OF [NI80FE20/CU/CO] MULTILAYERS
    VALET, T
    GALTIER, P
    JACQUET, JC
    MENY, C
    PANISSOD, P
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1993, 121 (1-3) : 402 - 405
  • [43] Pseudo-Hall effect and anisotropic magnetoresistance in a micronscale Ni80Fe20 device
    Yao, CC
    Hasko, DG
    Lee, WY
    Hirohata, A
    Xu, YB
    Bland, JAC
    IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (05) : 3616 - 3618
  • [44] Interlayer coupling in Ni80Fe20/Ru/Ni80Fe20 multilayer films: Ferromagnetic resonance experiments and theory
    Liu, X. M.
    Nguyen, Hoa T.
    Ding, J.
    Cottam, M. G.
    Adeyeye, A. O.
    PHYSICAL REVIEW B, 2014, 90 (06):
  • [45] Microwave assisted switching of single domain Ni80Fe20 elements
    Woltersdorf, Georg
    Back, Christian H.
    PHYSICAL REVIEW LETTERS, 2007, 99 (22)
  • [46] Exchange bias effect in Ni80Fe20/CoO bi-component nanowires
    Liu, X. M.
    Ding, J.
    Adeyeye, A. O.
    EPL, 2014, 108 (01)
  • [47] Direct imaging of domain-wall interactions in Ni80Fe20 planar nanowires
    Hayward, T. J.
    Bryan, M. T.
    Fry, P. W.
    Fundi, P. M.
    Gibbs, M. R. J.
    Allwood, D. A.
    Im, M-Y.
    Fischer, P.
    PHYSICAL REVIEW B, 2010, 81 (02)
  • [48] Magnonic crystals composed of Ni80Fe20 film on top of Ni80Fe20 two-dimensional dot array
    Liu, X. M.
    Ding, J.
    Kakazei, G. N.
    Adeyeye, A. O.
    APPLIED PHYSICS LETTERS, 2013, 103 (06)
  • [49] Angular dependence of the magnetic properties of cylindrical diameter modulated Ni80Fe20 nanowires
    Tejo, F.
    Vidal-Silva, N.
    Espejo, A. P.
    Escrig, J.
    JOURNAL OF APPLIED PHYSICS, 2014, 115 (17)
  • [50] Ni80Fe20/Al2O3/Ni80Fe20隧道结的TMR特性
    程遥
    徐小龙
    李燕飞
    福州大学学报(自然科学版), 2004, (03) : 289 - 290+379