Parametric and Reduced-Order Modeling for the Thermal Analysis of Nanoelectronic Structures

被引：1

作者：

Feng, Lihong ^{[1
]}

Meuris, Peter ^{[2
]}

Schoenmaker, Wim ^{[2
]}

Benner, Peter ^{[1
]}

机构：

[1] Max Planck Inst Dynam Complex Tech Syst, D-39106 Magdeburg, Germany

[2] Magwel NV, B-3000 Leuven, Belgium

来源：

SCIENTIFIC COMPUTING IN ELECTRICAL ENGINEERING (SCEE 2014) | 2016年 / 23卷

关键词：

D O I：

10.1007/978-3-319-30399-4_16

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work, we discuss the parametric modeling for the thermodynamic analysis of components of nanoelectronic structures and automatic model order reduction of the consequent parametric models. Given the system matrices at different values of the parameters, we introduce a simple method of extracting system matrices which are independent of the parameters, so that parametric models of a class of linear parametric problems can be constructed. Then the reduced-order models of the large-scale parametric models are automatically obtained using a posteriori output error bounds for the reduced-order models. A thermal problem with conductance variations is studied as an example to illustrate the proposed parametric modeling and model order reduction techniques.

引用

页码：155 / 163

页数：9

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