Emittance study of the high intensity highly charged heavy ion beams extracted from electron cyclotron resonance ion source

被引:2
|
作者
Fang, X. [1 ]
Sun, L. T. [1 ,2 ,3 ]
Yuan, Y. J. [1 ,2 ]
Qian, C. [1 ,2 ]
Yang, Y. [1 ]
Lu, W. [1 ]
Zhao, H. W. [1 ,2 ]
机构
[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
[2] Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China
[3] IMP, Lanzhou 730000, Peoples R China
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2020年 / 91卷 / 01期
关键词
Electron cyclotron resonance - Cyclotrons - Heavy ions - Ion sources - Phase space methods;
D O I
10.1063/1.5128638
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
According to the requirements of ion beams extracted from an electron cyclotron resonance ion source transverse phase space coupling research and the afterglow beam property effective measurement, a pepper pot type meter called PEMiL (Pepper Pot Emittance Meter in Lanzhou) has been designed, fabricated, and commissioned to obtain the emittance of high intensity highly charged heavy ion beams. The direct current beam emittance measurement results verify the coupling property caused by the semisolenoid field. This paper also describes the scheme of multiple exposure accumulation which was applied to measure the afterglow beam property, and the transverse phase space distribution of the oxygen afterglow beam which was measured for the first time is presented.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] On Optical Properties of Ion Beams Extracted From an Electron Cyclotron Resonance Ion Source
    Mironov, V.
    Bogomolov, S.
    Bondarchenko, A.
    Efremov, A.
    Loginov, V.
    PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON ION SOURCES, 2018, 2011
  • [2] Studies of emittance of multiply charged ions extracted from high temperature superconducting electron cyclotron resonance ion source, PKDELIS
    Rodrigues, G.
    Lakshmy, P. S.
    Kumar, Sarvesh
    Mandal, A.
    Kanjilal, D.
    Baskaran, R.
    Roy, A.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (02):
  • [3] Study on proton fraction of beams extracted from electron cyclotron resonance ion source
    Xu, R.
    Zhao, J.
    Peng, S. X.
    Yuan, Z. X.
    Song, Z. Z.
    Yu, J. X.
    Guo, Z. Y.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (02):
  • [4] Production of highly charged ion beams from electron cyclotron resonance ion sources
    Xie, Z.Q.
    Review of Scientific Instruments, 1998, 69 (2 pt 2):
  • [5] Review of highly charged heavy ion production with electron cyclotron resonance ion source (invited)
    Nakagawa, T.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (02):
  • [6] The longitudinal energy spread of ion beams extracted from an electron cyclotron resonance ion source
    Angot, J.
    Tarvainen, O.
    Chauveau, P.
    Kosonen, S. T.
    Kalvas, T.
    Thuillier, T.
    Migliore, M.
    Maunoury, L.
    JOURNAL OF INSTRUMENTATION, 2023, 18 (04)
  • [7] Electron Cyclotron Resonance Ion Sources for Highly-Charged Ion Beams
    Koivisto, H.
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, 2009, 1099 : 25 - 30
  • [8] Production of highly charged ion beams with the Grenoble test electron cyclotron resonance ion source (plenary)
    Hitz, D
    Girard, A
    Serebrennikov, K
    Melin, G
    Cormier, D
    Mathonnet, JM
    Chartier, J
    Sun, L
    Briand, JP
    Benhachoum, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05): : 1403 - 1406
  • [9] Production of highly charged ion beams from electron cyclotron resonance ion sources (invited)
    Xie, ZQ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 625 - 630
  • [10] Emittance measurement of highly charged ion beams extracted from ECR ion source using electric sweep scanner
    Cao, Y
    Ma, L
    Zhao, HW
    Zhang, ZM
    Sun, LT
    Li, JY
    Feng, YC
    Li, XX
    HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2004, 28 (08): : 885 - 888