Emittance measurement of highly charged ion beams extracted from ECR ion source using electric sweep scanner

被引：0

作者：

Cao, Y ^{[1
]}

Ma, L ^{[1
]}

Zhao, HW ^{[1
]}

Zhang, ZM ^{[1
]}

Sun, LT ^{[1
]}

Li, JY ^{[1
]}

Feng, YC ^{[1
]}

Li, XX ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

来源：

HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION | 2004年 / 28卷 / 08期

关键词：

electric sweep scanner; ECR ion source; emittance;

D O I：

暂无

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

We have designed and built an emittance scanner which was installed at the beam line LECR3 of the heavy Ion Accelerator Facility in Lanzhou. The scanner measures the emittance of beams from the ECR ion source by the electric-sweep method, named as Electric-Sweep Scanner(ESS). From analyzing the measured results we found it is contrary to the behavior expected from normal theory of ECR plasma. Typical results are as follows: when the extracted voltage is 15.97kV, total current is 190muA, the horizontal and vertical emittance of O4+ are 137pimm.mrad and 120pimm.mrad respectively.

引用

页码：885 / 888

页数：4

共 8 条

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