Microscopy based on measuring the optical trapping force between a scanning probe tip and sample

被引：0
|
作者：
Wickramasinghe, Hemanta Kumar [1 ]
机构：
[1] Univ Calif Irvine, Irvine, CA USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2019年 / 258卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
232-PHYS
引用
收藏
页数：1
相关论文
共 50 条
  • [31] Electrostatic tip effects in scanning probe microscopy of nanostructures
    Casper, Clayton B.
    Ritchie, Earl T.
    Teitsworth, Taylor S.
    Kabos, Pavel
    Cahoon, James F.
    Berweger, Samuel
    Atkin, Joanna M.
    NANOTECHNOLOGY, 2021, 32 (19)
  • [32] TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY
    CIRACI, S
    BARATOFF, A
    BATRA, IP
    PHYSICAL REVIEW B, 1990, 41 (05): : 2763 - 2775
  • [33] Ferroelectric switching by the grounded scanning probe microscopy tip
    Ievlev, A. V.
    Morozovska, A. N.
    Shur, V. Ya
    Kalinin, S. V.
    PHYSICAL REVIEW B, 2015, 91 (21)
  • [34] THE CONVOLUTION OF THE TIP-SAMPLE CONTACT STIFFNESS AND THE CANTILEVER STIFFNESS IN SCANNING FORCE AND FRICTION MICROSCOPY
    BURNHAM, NA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 205 : 348 - COLL
  • [35] Micromachined aperture probe tip for multifunctional scanning probe microscopy.
    Abraham, M
    Ehrfeld, W
    Lacher, M
    Marti, O
    Mayr, K
    Noell, W
    Guthner, P
    Barenz, J
    MICRO-OPTICAL TECHNOLOGIES FOR MEASUREMENT, SENSORS, AND MICROSYSTEMS II AND OPTICAL FIBER SENSOR TECHNOLOGIES AND APPLICATIONS, 1997, 3099 : 248 - 256
  • [36] Micromachined aperture probe tip for multifunctional scanning probe microscopy.
    Abraham, M
    Ehrfeld, W
    Lacher, M
    Mayr, K
    Noell, W
    Gunther, P
    Barenz, J
    MICROMACHINING AND IMAGING, 1997, 3009 : 34 - 42
  • [37] SCANNING PROBE MICROSCOPY: MEASURING ON HARD SURFACES
    Matejka, Milan
    Urbanek, Michal
    Kolarik, Vladimir
    NANOCON 2011, 2011, : 701 - 704
  • [38] Measuring static charges by scanning probe microscopy
    Taylor, DM
    Sayers, PWC
    ELECTROSTATICS 1999, 1999, 163 : 377 - 380
  • [39] Optical Forces in Scanning Probe Microscopy
    Kohlgraf-Owens, Dana C.
    Sukhov, Sergey
    Dogariu, Aristide
    2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2011,
  • [40] Innovations in optical scanning probe microscopy
    Aden, G
    PHOTONICS SPECTRA, 1999, 33 (01) : 112 - 113
12345