Measurement of modulation transfer function of infrared optoelectronic detector

被引:0
|
作者
Lei, Liu [1 ]
Bing, Chen [1 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Elect Engn & Photoelect Technol, Nanjing, Peoples R China
关键词
MTF; knife-edge scanning function; line spread function; fourier transform; spatial frequency;
D O I
10.1117/12.723336
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.
引用
收藏
页数:6
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