X-ray fluorescence spectroscopy for accurate copper estimation

被引：7

作者：

Escarate, P. ^{[1
]}

Hein, R. ^{[2
]}

Duran, M. ^{[3
]}

Ramaciotti, P. ^{[3
,4
]}

机构：

[1] Univ Tecn Federico Santa Marfa, Dept Elect, Valparaiso, Chile

[2] Ingenieros Matemat Consultores Asociados SA INGMA, Santiago, Chile

[3] Pontificia Univ Catolica Chile, Escuela Ingn, Santiago, Chile

[4] Ecole Polytech, CNRS, CMAP, F-91128 Palaiseau, France

来源：

MINERALS ENGINEERING | 2015年 / 71卷

关键词：

X-ray fluorescence spectroscopy; Artificial neural networks; Measurement of copper content;

D O I：

10.1016/j.mineng.2014.10.016

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

This work presents a technique for a rapid and accuracy measurement of copper content using X-ray fluorescence spectroscopy (XRF). This approach improves the accuracy and shortens the measuring time with respect to the current laboratory procedures from hours to 30 s. The models were calibrated and validated via the correlation coefficients (R-c(2) and R-v(2)), the error of prediction (RMSEP) and the error of calibration (RMSEC). The calibration and validation were performed for copper content ranges of 0.04-2.9%. An R-v(2) value of 0.9886 and a RMSEP value of 0.0890 were obtained, showing the accuracy of this method for continuous, real-time and on-line estimation of copper content. (C) 2014 Elsevier Ltd. All rights reserved.

引用

页码：13 / 15

页数：3

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