In-situ measuring the electronic structure of nanocrystal thin films using energy-resolved electrochemical impedance spectroscopy

被引：0
|
作者：
Volk, Sebastian [1 ]
Yazdani, Nuri [1 ]
Yarema, Olesya [1 ]
Yarema, Maksym [1 ]
Wood, Vanessa [2 ]
机构：
[1] Swiss Fed Inst Technol, Zurich, Switzerland
[2] Swiss Fed Inst Technol, Informat Technol & Elect Engn, Zurich, Switzerland
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2018年 / 256卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
519-COLL
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页数：2
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