Three-dimensional microanalysis using FIB SEM: Variations in technique

被引：1
|
作者：
Scott, Keana [1 ]
Davis, Jeffrey M. [1 ]
Vicenzi, Edward P. [2 ]
机构：
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] Museum Conservat Inst, Smithsonian Inst, Suitland, MD 20746 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S143192760909744X
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：476 / 477
页数：2
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