Grain quality traits in a sorghum association mapping panel

被引：0
|
作者：
Bean, Scott [1 ]
Herald, Thomas [1 ]
Wilson, Jeff [1 ]
Gadgil, Priyadarshini [1 ]
Kaufman, Rhett [1 ]
Ioerger, Brian [1 ]
机构：
[1] ARS, USDA, Manhattan, KS USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2015年 / 249卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
75
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页数：2
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