An Introduction to Inelastic X-Ray Scattering

被引：3
|
作者：
Rueff, J. -P. [1 ]
机构：
[1] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France
来源：
MAGNETISM AND SYNCHROTRON RADIATION: NEW TRENDS | 2010年 / 133卷
关键词：
RAMAN-SCATTERING; METALS;
D O I：
10.1007/978-3-642-04498-4_9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The article provides a brief but up-to-date overview of inelastic X-ray scattering (IXS), a powerful spectroscopic probe of the electronic and dynamical properties. We introduce in first part the basic theoretical concepts for both resonant and nonresonant IXS, including resonant X-ray emission, absorption in the partial fluorescence yield mode, and X-ray Raman scattering. This formal section is followed by examples borrowed from the recent literature, with an emphasis on high pressure physics, strongly correlated materials, and new instrumentation.
引用
收藏
页码：263 / 277
页数：15
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