Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O3, Pb(Sc0.5Nb0.5)O3 and Pb(Mg1/3Nb2/3)O3 films produced by RF-sputtering from ceramic targets

被引：3
|
作者：
Ziebert, C [1 ]
Sternberg, A
Schmitt, H
Ehses, KH
Krüger, JK
机构：
[1] Univ Saarlandes, FB Phys, D-66123 Saarbrucken, Germany
[2] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia
来源：
INTEGRATED FERROELECTRICS | 2000年 / 31卷 / 1-4期
关键词：
relaxer; nanocrystalline; diffuse phase transition; superlattice;
D O I：
10.1080/10584580008215652
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Nanocrystalline thin films of different relaxer materials, namely Pb(Sc0.5T0.5)O-3 (PST), Pb(Sc0.5Nb0.5)O-3(PSN), Pb(Mg1/3Nb2/3)O-3(PMN) have been produced by RF-sputtering to investigate whether it will affect their dielectric properties if their grain size is reduced to the dimensions known from their nanodomains. The XRD shows that the amorphous film crystallizes in pyrochlore structure at lower temperatures and short times. Annealing at higher temperatures and far longer time intervals leads to an increasing amount of perovskite phase with a grain size in the nanometer range. These results including dielectric measurements will be presented and discussed.
引用
收藏
页码：183 / 193
页数：11
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