Effect of Processing Routes on the Microstructure and Thermoelectric Properties of Half-Heusler TiFe0.5Ni0.5Sb1-xSnx (x=0, 0.05, 0.1, 0.2) Alloys

被引:9
|
作者
Karati, Anirudha [1 ]
Ghosh, Sanyukta [2 ]
Mallik, Ramesh Chandra [2 ]
Shabadi, Rajashekhara [3 ]
Murty, B. S. [1 ,4 ,5 ]
Varadaraju, U. V. [1 ]
机构
[1] Indian Inst Technol Madras, Dept Chem, Chennai, Tamil Nadu, India
[2] Indian Inst Sci, Dept Phys, Thermoelect Mat & Devices Lab, Bangalore, Karnataka, India
[3] Univ Lille, Fac Sci & Technol, UMET, Villeneuve Dascq, France
[4] Indian Inst Technol Madras, Dept Met & Mat Engn, Chennai, Tamil Nadu, India
[5] Indian Inst Technol Hyderabad, Kandi, India
关键词
intermetallic alloys; powder metallurgy; semiconductors; sintering; PERFORMANCE; PHASES; METAL;
D O I
10.1007/s11665-021-06207-z
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sn-doped TiFe0.5Ni0.5Sb1-xSnx (x = 0, 0.05, 0.1, 0.2) were synthesized by vacuum arc melting (VAM). In addition to the half-Heusler phase, secondary phases of Fe-Sb-rich compound and Ti-rich compounds were obtained after VAM. The alloys were then subjected to ball milling for 1 h and 5 h. Ball milling for 1h led to microcrystalline grains, while that for 5 h led to nanocrystalline grains. Ball milling followed by spark plasma sintering (SPS) at 1173 K led to significant reduction in size of secondary phases in the microstructure. The undoped sample exhibited a ZT of 0.008 at 873 K for both 1h and 5h BM-SPS samples.
引用
收藏
页码:305 / 317
页数:13
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