A Large "Read" and "Write" Margins, Low Leakage Power, Six-Transistor 90-nm CMOS SRAM

被引:0
|
作者
Enomoto, Tadayoshi [1 ]
Kobayashi, Nobuaki [1 ]
机构
[1] Chuo Univ, Tokyo 1128551, Japan
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2011年 / E94C卷 / 04期
关键词
SRAM; leakage power; write" margin; read" margin;
D O I
10.1587/transele.E94.C.530
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We developed and applied a new circuit, called the "Self-controllable Voltage Level (SVL)" circuit, to achieve an expanded "read" and "write" margins and low leakage power in a 90-nm, 2-kbit, six-transistor CMOS SRAM. At the threshold voltage fluctuation of 6 sigma, the minimum supply voltage of the newly developed (dvlp.) SRAM for "write" operation was significantly reduced to 0.11 V. less than half that of an equivalent conventional (cony.) SRAM. The standby leakage power of the dvlp. SRAM was only 1.17 mu W, which is 4.64% of that of the cony. SRAM at supply voltage of 1.0 V. Moreover, the maximum operating clock frequency of the dvlp. SRAM was 138 MHz, which is 15% higher than that (120 MHz) of the cony. SRAM at V-MM of 0.4 V. An area overhead was 0.81% that of the cony. SRAM.
引用
收藏
页码:530 / 538
页数:9
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