Comparison of alloy disorder scatterings in Ga- and N-polar AlGaN/GaN heterostructures

被引:5
|
作者
Kang, He [1 ]
Li, Hui-Jie [2 ,3 ]
Yang, Shao-Yan [2 ,3 ]
Zhang, Wei [1 ]
Zhu, Ming [1 ]
Liu, Li [1 ]
Li, Nan [1 ]
机构
[1] China Aerosp Components Engn Ctr, Beijing 100094, Peoples R China
[2] Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China
[3] Chinese Acad Sci, Beijing Key Lab Low Dimens Semicond Mat & Devices, Inst Semicond, POB 912, Beijing 100083, Peoples R China
来源
基金
美国国家科学基金会; 国家重点研发计划;
关键词
Two-dimensional electron gas; alloy disorder scattering; GaN; polarization effect; 2-DIMENSIONAL ELECTRON GASES; HETEROJUNCTION;
D O I
10.1142/S0217979218500029
中图分类号
O59 [应用物理学];
学科分类号
摘要
The two-dimensional electron gas (2DEG) mobilities limited by alloy disorder (AD) scattering in both Ga- and N-polar AlGaN/GaN heterostructures are investigated. It was found that the AD scattering limited electron mobility in N-polar heterostructures is on the order of 10(3)10(4) cm(2)/Vs, which is comparable to the optical phonon scattering at room-temperature. In comparison, the AD scattering in Ga-polar samples is much less important. Moreover, the electron mobility decreases with the 2DEG density in the Ga-polar device but shows a reverse trend in the N-polar counterpart. This is found to be caused by the rather different electric field distributions in Ga- and N-polar AlGaN/GaN heterostructures. In addition, we find that an AlN interlayer can effectively reduce the alloy scattering, mainly due to the large band offset between AlN and GaN. The calculated mobilities have been compared with the experiment results and good agreements are found. We believe that our results are important for the design of AlGaN/GaN heterostructure-based devices, especially the N-polar ones.
引用
收藏
页数:10
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