Fingered morphology of niobium (110) grown by molecular-beam epitaxy

被引：16
|
作者：
Zhou, GL [1 ]
Flynn, CP [1 ]
机构：
[1] Univ Illinois, Mat Res Lab, Urbana, IL 61801 USA
来源：
PHYSICAL REVIEW B | 1999年 / 59卷 / 12期
关键词：
D O I：
10.1103/PhysRevB.59.7860
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We report a regime of temperature film thickness and substrate miscut in which thin films of niobium (110) grow faceted on sapphire (11 (2) over bar 0), and with a surface morphology that contains long fingers oriented along the niobium in-plane [001] direction. The origins of these features are discussed. [S0163-1829(99)06011-7].
引用
收藏
页码：7860 / 7867
页数：8
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