Structural and electrical properties of sputtered titanium boronitride films

被引:22
|
作者
Pierson, JF
Bertran, F
Bauer, JP
Jolly, J
机构
[1] Univ Franche Comte, Ctr Rech Ecoulements Surfaces & Transferts, UMR CNRS 6000, F-25211 Montbeliard, France
[2] Univ Henri Poincare, Phys Mat Lab, UMR CNRS 7556, F-54506 Vandoeuvre Les Nancy, France
[3] Ecole Polytech, Lab Phys & Technol Plasmas, UMR CNRS 7648, F-91128 Palaiseau, France
来源
关键词
reactive sputtering; Ti-B-N nanocomposite; photoelectron spectroscopy; resistivity;
D O I
10.1016/S0257-8972(01)01124-0
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Titanium boronitride (TiBN) films are deposited on steel and glass substrates by DC magnetron sputtering of a TiB2 target in various Ar-N-2 mixtures. In this report the electrical properties of TiBN films are investigated in connection with their structure. At low nitrogen flow rate, the films are nanocrystallized in a TiB2-like structure. On the other hand at high nitrogen flow rate, TiBN films contain nanocrystals of TiN probably embedded in a boron nitride amorphous matrix. The electrical resistivity of TiBN films increases continuously with the nitrogen flow rate. The thermal behaviour of the electrical resistance shows that coatings with a TiB2-like structure have a positive temperature coefficient of resistance, whereas samples obtained under high nitrogen flow rate exhibit a negative one. These results are discussed together with those obtained from high-resolution photoemission spectroscopy, which gives evidence to the metallic character for all deposits. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:906 / 910
页数:5
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