Diffusion lengths of excited carriers in CdxZn1-xSe quantum wells

被引:13
|
作者
Chao, LL
Cargill, GS
Snoeks, E
Marshall, T
Petruzzello, J
Pashley, M
机构
[1] Columbia Univ, Dept Chem Engn Mat Sci & Min Engn, New York, NY 10027 USA
[2] Philips Elect N Amer Corp, Philips Res, Briarcliff Manor, NY 10510 USA
关键词
D O I
10.1063/1.123109
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diffusion lengths of excited carriers in a CdxZn1-xSe multiple quantum well structure were determined for temperatures between room temperature and 8 K from cathodoluminescence measurements. The diffusion length was found to depend upon temperature and Cd concentration of the quantum well. For the highest Cd concentration (x=0.43), the diffusion length increased with temperature up to 225 K and then dropped at higher temperatures. Diffusion lengths were 0.21 mu m at 8 K, 0.38 mu m at 225 K, and 0.24 mu m at room temperature. For the well with least Cd concentration (x=0.24), longer diffusion lengths were obtained. The nature of the diffusing carriers is also discussed. (C) 1999 American Institute of Physics. [S0003-6951(99)03905-4].
引用
收藏
页码:741 / 743
页数:3
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