Nematic liquid crystal dynamics under applied electric fields

被引:21
|
作者
de Oliveira, B. F. [1 ,2 ,3 ]
Avelino, P. P. [1 ,2 ,3 ]
Moraes, F. [3 ]
Oliveira, J. C. R. E. [1 ,4 ]
机构
[1] Ctr Fis Porto, P-4169007 Oporto, Portugal
[2] Univ Porto, Dept Fis, Fac Ciencias, P-4169007 Oporto, Portugal
[3] Univ Fed Paraiba, Dept Fis, BR-58051970 Joao Pessoa, Paraiba, Brazil
[4] Univ Porto, Dept Engn Fis, Fac Engn, P-4200465 Oporto, Portugal
关键词
TOPOLOGICAL DEFECTS; LIGHT;
D O I
10.1103/PhysRevE.82.041707
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
In this paper we investigate the coarsening dynamics of liquid crystal textures in a two-dimensional nematic under applied electric fields, using numerical simulations performed using a publicly available liquid crystal algorithm developed by the authors. We consider both positive and negative dielectric anisotropies and two different possibilities for the orientation of the electric field (parallel and perpendicular to the two-dimensional lattice). We determine the effect of an applied electric field pulse on the evolution of the characteristic length scale and other properties of the liquid crystal texture network. In particular, we show that different types of defects are produced after the electric field is switched on, depending on the orientation of the electric field and the sign of the dielectric anisotropy.
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页数:7
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