Distance-based Test-Suite Reduction for Efficient Testing-based Fault Localization

被引:1
|
作者
Wang, Xingya [1 ]
Jiang, Shujuan [1 ,3 ]
Gao, Pengfei [1 ]
Ju, Xiaolin [2 ]
Wang, Rongcun [1 ]
Zhang, Yanmei [1 ]
机构
[1] China Univ Min & Technol, Sch Comp Sci & Technol, Xuzhou, Peoples R China
[2] Nantong Univ, Sch Comp Sci & Technol, Nantong, Peoples R China
[3] Guilin Univ Elect Technol, Guangxi Key Lab Trusted Software, Guilin, Peoples R China
关键词
program debugging; fault localization; test-suite reduction; distance estimation; SPECTRUM;
D O I
10.1109/SATE.2016.21
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.
引用
收藏
页码:84 / 89
页数:6
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