Mechanical properties of the X-ray irradiated DLC films containing SiOx as a constructive element for radiation detectors

被引:4
|
作者
Adliene, D. [1 ]
Laurikaitiene, J. [1 ]
Andrulevicius, M. [2 ]
Guobiene, A. [2 ]
Meskinis, M. [2 ]
Cibulskaite, I. [1 ]
Tamulevicius, S. [1 ,2 ]
机构
[1] Kaunas Univ Technol, Dept Phys, LT-51368 Kaunas, Lithuania
[2] Kaunas Univ Technol, Inst Phys Elect, LT-50131 Kaunas, Lithuania
关键词
X-ray photons; SiOx-containing DLC films; radiation effects; bonding structure; chemical composition; mechanical properties;
D O I
10.1016/j.nima.2008.03.053
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Evolution of physical properties and radiation-induced changes of the film composition and chemical bonding structure have been investigated in ion beam deposited and SiOx-containing DLC films after their exposure to high-energy X-ray photons generated in medical linear accelerator aiming the possible use of these films as protective coatings or passive layers in the construction of radiation detectors. Mechanical properties of the irradiated films were characterized by microhardness measurements and atomic force microscopy and were analyzed in parallel with the optical properties of the investigated samples. Chemical bonding structure of the DLC films was estimated by Raman spectroscopy (RS). Atomic composition of the films was evaluated from the X-ray photoelectron spectroscopy (XPS) measurements. Changes in surface morphology and increased hardness of the investigated samples as compared to the initial samples were observed. Comparing the results of investigation of SiOx-containing DLC films with those obtained for undoped hydrogenated DLC films, it was possible to figure out the relationship between radiation-induced structural changes and modification of the properties of different DLC films during irradiation by high-energy X-ray photons. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:188 / 191
页数:4
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