BugVis: Commit Slicing for Fault Visualisation

被引：1
|
作者：
Bowes, David [1 ]
Petric, Jean [1 ]
Hall, Tracy [1 ]
机构：
[1] Univ Lancaster, Lancaster, England
来源：
2020 IEEE/ACM 28TH INTERNATIONAL CONFERENCE ON PROGRAM COMPREHENSION, ICPC | 2020年
基金：
英国工程与自然科学研究理事会;
关键词：
commit; fault; bug; fix; visualisation;
D O I：
10.1145/3387904.3389299
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
In this paper we present BugVis, our tool which allows the visualisation of the lifetime of a code fault. The commit history of the fault from insertion to fix is visualised. Unlike previous similar tools, BugVis visualises only the lines of each commit involved in the fault. The visualisation creates a commit slice throughout the history of the fault which enables comprehension of the evolution of the code involved in the fault.
引用
收藏
页码：436 / 440
页数：5
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