X-ray diffraction analysis of the recrystallization behavior of SiCw/Al composite at high temperature

被引：5
|
作者：
Jiang, CH [1 ]
Ye, CQ [1 ]
Hong, B [1 ]
机构：
[1] Shanghai Jiao Tong Univ, Sch Mat Sci & Engn, Shanghai 200030, Peoples R China
来源：
MATERIALS TRANSACTIONS | 2005年 / 46卷 / 10期
关键词：
SiCw/aluminum composite; recrystallization; X-ray diffraction;
D O I：
10.2320/matertrans.46.2125
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
By using the method of in-situ X-ray diffraction and profile analysis, the variation of grain size and microstrain of the cold-rolled SiCw/Al composite at high temperature was measured, and the recrystallization behavior of the composite was investigated. Test results showed that the activation energy of grain growth after recrystallization and recovery at higher temperature of matrix in composite is close to the activation energy for self-diffusion of pure Al. It was verified that the recovery phenomenon was accompanied with the grain growth, and the whiskers cannot affect the grain growth and recovery of matrix in composite at higher temperature.
引用
收藏
页码：2125 / 2128
页数：4
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