Design of Test Paper Automatic Generation Based on C#

被引：0
|
作者：
Zhou, Dong-Sheng [1 ]
Pan, Fei [2 ]
Gao, Jia-Ming [1 ]
Xu, Mao-Ye [1 ]
机构：
[1] Shenyang Agr Univ, Coll Informat & Elect Engn, Shenyang, Liaoning, Peoples R China
[2] Shenyang Agr Univ, Network Ctr, Shenyang, Liaoning, Peoples R China
来源：
2016 3RD INTERNATIONAL CONFERENCE ON ADVANCED EDUCATION AND MANAGEMENT (ICAEM 2016) | 2016年
关键词：
Test Paper; C#; Word; Database; Duplicate Checking; Automatic;
D O I：
暂无
中图分类号：
G40 [教育学];
学科分类号：
040101 ; 120403 ;
摘要：
This paper mainly introduces a system about automatic test paper generation and duplicate checking based on the C# and SQL server 2008. The discuss how to use C# to operate Microsoft word 2010, including character formatting, domain controller, duplicate checking of word documents etc. Through the combination of C#, SQL Server 2008 and Word 2010, C# operates SQL server and read the data from it, outputs the data to the Word documents and formats the text. The software reduces labor capacity, the teacher only input the examination data and don't consider the text format. Using the VBA programming, realizes the duplicate checking of over two Word documents, provides the repetitive rate. If the rate is over the setting rate, then the software can give the alert.
引用
收藏
页码：390 / 393
页数：4
相关论文
共 50 条
  • [41] Automatic test generation with AGATHA
    Bigot, C
    Faivre, A
    Gallois, JP
    Lapitre, A
    Lugato, D
    Pierron, JY
    Rapin, N
    TOOLS AND ALGORITHMS FOR THE CONSTRUCTION AND ANALYSIS OF SYSTEMS, PROCEEDINGS, 2003, 2619 : 591 - 596
  • [42] Automatic Test Packet Generation
    Zeng, Hongyi
    Kazemian, Peyman
    Varghese, George
    McKeown, Nick
    IEEE-ACM TRANSACTIONS ON NETWORKING, 2014, 22 (02) : 554 - 566
  • [43] AUTOMATIC TEST PATTERN GENERATION
    DERBYSHIRE, K
    ELECTRONIC ENGINEERING, 1993, 65 (802): : S57 - &
  • [44] AUTOMATIC TEST SEQUENCE GENERATION
    SALZMANN, CH
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1977, 13 (02) : 223 - 223
  • [45] Automatic test pattern generation
    Drechsler, Rolf
    Fey, Gorschwin
    FORMAL METHODS FOR HARDWARE VERIFICATION, 2006, 3965 : 30 - 55
  • [46] Automatic test generation for predicates
    Paradkar, A
    Tai, KC
    Vouk, MA
    SEVENTH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS, 1996, : 66 - 75
  • [47] Automatic Parameterized Generation of Test
    Gangur, Mikulas
    DIVAI 2014: 10TH INTERNATIONAL SCIENTIFIC CONFERENCE ON DISTANCE LEARNING IN APPLIED INFORMATICS, 2014, : 55 - 64
  • [48] Study of Software Development Method of Battery Test Platform Based on Simulink and C#
    Ke, Gao
    Bing-Xiang, Sun
    Tian, Pan
    Jun-Iong, Niu
    Jia-Peng, Wen
    Ta, Feng
    Jun, Liu
    2014 IEEE TRANSPORTATION ELECTRIFICATION CONFERENCE AND EXPO (ITEC) ASIA-PACIFIC 2014, 2014,
  • [49] Design and implementation of automatic test system based on network
    Xie, Yong
    Wang, Zhen-Yu
    Liu, Si-Fang
    Xia, Li-Li
    PROCEEDINGS OF THE 2ND ANNUAL INTERNATIONAL CONFERENCE ON ELECTRONICS, ELECTRICAL ENGINEERING AND INFORMATION SCIENCE (EEEIS 2016), 2016, 117 : 542 - 549
  • [50] Automatic Test System Design Based On Generalization Platform
    Wei Yan
    Zhang Peng
    Qi Tao
    Guo Shiyong
    Du Baolin
    Gan Hui
    SIXTH SYMPOSIUM ON NOVEL OPTOELECTRONIC DETECTION TECHNOLOGY AND APPLICATIONS, 2020, 11455
12345