共 50 条
- [36] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 283 - 283
- [37] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 283 - 283
- [38] COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1286 - 1289
- [39] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02): : 221 - 224
- [40] Beam damage of polypropylene in the environmental scanning electron microscope: an FTIR study JOURNAL OF MICROSCOPY-OXFORD, 1998, 190 : 357 - 365