Effect of bending strain on the critical current of Bi-2223/Ag tapes with different structures

被引：20
|
作者：
Sun, SJ [1 ]
Liu, W
Chen, XP
Li, MY
Han, Z
机构：
[1] Tsing Hua Univ, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
[2] Tsing Hua Univ, Appl Superconduct Res Ctr, Beijing 100084, Peoples R China
来源：
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2003年 / 16卷 / 09期
关键词：
D O I：
10.1088/0953-2048/16/9/304
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have evaluated the effect of bending strain on the critical current of Bi-2223/Ag tapes with different structures. The measured results were analysed using a symmetric pure bending model. The irreversible degradation indicates that the I-c reduction is caused mainly by crack formation and propagation in the brittle Bi-2223 ceramic core. Experimented results have shown that the number of filaments, as well as the structure of the tapes, could have strong effects on the measured apparent critical values of the tapes. Multifilamentary tapes showed better performance compared with single core tapes. The bending strain tolerance of the tape could be improved by adding a metal strip on the upper side of the tape.
引用
收藏
页码：984 / 987
页数：4
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