Automatic detection and high resolution fine structure analysis of conic X-ray diffraction lines

被引：4

作者：

Bauch, J. ^{[1
]}

Henschel, F. ^{[1
]}

Schulze, M. ^{[2
]}

机构：

[1] Tech Univ Dresden, Inst Werkstoffwissensch, D-01069 Dresden, Germany

[2] Tech Univ Dresden, Inst Photogrammetrie & Fernerkundung, D-01069 Dresden, Germany

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 2011年 / 46卷 / 05期

关键词：

X-ray microdiffraction; automatic reflection detection; Hough transform; KOSSEL-technique; XRT technique; determination of residual stress; KOSSEL;

D O I：

10.1002/crat.201000608

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The presented method demonstrates a first step in the development of a high resolution "Residual stress microscope" and facilitates through the implementation of largely automated procedures a fast detection of diffraction lines in the form of conic sections. It has been implemented for, but is not exclusively used for the KOSSEL technique and the "X-ray Rotation-Tilt Method" (XRT). The resulting multifaceted evaluable data base of many X-ray diffraction radiographies can be used not only for the systematic analysis of anomalies in diffraction lines (reflection fine structure), but also for direct calculation and output of precision residual stress tensors. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：450 / 454

页数：5

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