Development of a fast CCD Camera for Electron Diffraction Imaging in Conventional TEM

被引：1
|
作者：
Mollon, Bill [1 ]
Pan, Ming [1 ]
Jia, Yan [1 ]
Mooney, Paul [1 ]
Sha, Tom [1 ]
机构：
[1] Gatan Inc, Pleasanton, CA 94588 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609096652
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：166 / 167
页数：2
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