Analytical envelope correlation and outage probability of maximal-ratio combined Rician fading channels

被引：0
|
作者：
Wang, Zhuwei [1 ]
Hu, Yanfen [1 ]
Chen, Xubin [1 ]
Zhang, Xin [1 ]
Yang, Dacheng [1 ]
机构：
[1] Beijing Univ Posts & Telecommun, Wireless Theories & Technol Lab, Beijing 100088, Peoples R China
来源：
2007 IEEE 66TH VEHICULAR TECHNOLOGY CONFERENCE, VOLS 1-5 | 2007年
关键词：
envelope correlation coefficient (ECC); outage probability; maximal ratio combining (MRC); correlated;
D O I：
10.1109/VETECF.2007.202
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this paper, with minor approximation, we provide analytical expressions in a close form for the envelope correlation coefficient (ECC) and outage probability of the maximal ratio combining (MRC) output in correlated Rayleigh and Rician fading environments. Moreover, we find a simple relationship between ECC and the outage probability, which indicates that ECC can be used to predict system performance such as outage probability quantitatively. Besides, it has been demonstrated by Monte Carlo simulation that our analysis are matched with the numerical results excellently.
引用
收藏
页码：926 / 930
页数：5
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