Chipless RFID Tag Discrimination and the Performance of Resemblance Metrics to be used for it

被引:0
|
作者
Ali, Zeshan [1 ]
Barbot, Nicolas [1 ]
Siragusa, Romain [1 ]
Hely, David [1 ]
Bernier, Maxime [2 ]
Garet, Frederic [2 ]
Perret, Etienne [1 ,3 ]
机构
[1] Univ Grenoble Alpes, Grenoble INP, LCIS, F-26000 Valence, France
[2] Univ Savoie Mt Blanc, CNRS, Grenoble INP, IMEP LAHC, F-73376 Le Bourget Du Lac, France
[3] Inst Univ France, F-75005 Paris, France
来源
2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS | 2018年
关键词
Authentication technology; chipless RFID; fabrication tolerance; radar approach; randomness;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a novel radar based approach for chipless tag discrimination. The proposed technique can be considered as a first step towards chipless authentication of manufactured products. The concept of chipless radiofrequency identification (RFID) is extended to tag discrimination, where each tag produces a unique signature that is very difficult to reproduce even if a clone of the device is made. The proposed technique, using radiofrequency (RF) electromagnetic (EM), keeps non-invasive and non-destructive. This new method to discriminate tag's RF signature is introduced based on the comparison between two resemblance metrics in the frequency domain and time domain. To calculate the resemblance between different signatures entire part of the RF signatures is exploited to utilize the maximum signals' richness. Owing to the chipless RF approach, we show that geometrical variations less than 10 mu m (i.e., smaller than lambda/1000) can be detected which demonstrate the extreme sensitivity of the method.
引用
收藏
页码:363 / 366
页数:4
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