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Fabrication of highly (001) oriented L10 FePt thin film using NiTa seed layer
被引:10
|作者:
Maeda, T
[1
]
机构:
[1] Toshiba Co Ltd, Ctr Corp Res & Dev, Kawasaki, Kanagawa 2128582, Japan
关键词:
FePt;
high anisotropy material;
O-2;
exposure;
Ni-Ta;
order parameter;
(001) orientation;
perpendicular magnetic recording media;
seed layer;
D O I:
10.1109/TMAG.2005.855203
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A highly (001) oriented L1(0) FePt thin film has been successfully fabricated on glass disk substrates by using Ni-Ta alloy seed layer with O-2 exposure process. The (001) orientation of Fe-Pt was improved by exposing Ni-Ta surface to O-2 ambient in the deposition process of Ni-Ta/Cr/Pt/Fe-Pt film. An excess O-2 exposure degrades the coercivity because of the suppression of the ordering of FePt. Under the Optimum O-2 exposure condition, perpendicular coercivity of as large as 6.9 kOe was achieved with good squareness and little remanence in the in-plane magnetization curve for the film stack of Ni-Ta (5 nm)/Cr (5 nm)/Pt (10 nm)/Fe-Pt (10 nm)/C (7 nm) structure. The total thickness of the underlayers is as thin as 20 nm.
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页码:3331 / 3333
页数:3
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