Device Physics and EM Simulation Based Modeling Methodology for LDMOS RF Power Transistors

被引:0
|
作者
Lamey, Dan [1 ]
Zhang, Lei [1 ]
Rueda, Hernan [1 ]
Kabir, Humayun [1 ]
Sweeney, Rick [1 ]
Kim, Kevin [1 ]
机构
[1] NXP Semicond, RF Power, Chandler, AZ 85224 USA
关键词
device physics; electromagnetics (EM); laterally diffused metal-oxide-semiconductor (LDMOS) transistor; modeling; MOBILITY MODEL;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, process, device, and electromagnetic simulations are combined to produce a distributed nonlinear model for an LDMOS RF power transistor. The simulation challenges are handled by using multiple simulators, each with a suitable role in the modeling process. Semiconductor fabrication and device operation are performed through the process and device technology computer aided design (TCAD) tool. The outcome from the TCAD simulations are used to generate a nonlinear compact model for a small section of the device. To form the complete transistor model, many small sections of the compact model are connected by a large-scale interconnect network, which is modeled based on electromagnetic (EM) simulations. For convenient use in circuit simulator, the distributed nonlinear model is implemented by a script-generated comprehensive netlist. It is demonstrated that this purely simulation-based model can accurately predict device behavior under DC, small-signal, and large-signal tests, and is useful for first-pass computer-aided design before wafer fabrication.
引用
收藏
页码:79 / 81
页数:3
相关论文
共 50 条
  • [21] Effect of Drift Region Resistance on Temperature Characteristics of RF Power LDMOS Transistors
    Chen, Kun-Ming
    Chen, Bo-Yuan
    Chen, Hsueh-Wei
    Chiu, Chia-Sung
    Huang, Guo-Wei
    Chang, Chia-Hao
    Hu, Hsin-Hui
    2013 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM (RFIC), 2013, : 443 - 446
  • [22] An Extrinsic Component Parameter Extraction Method for High Power RF LDMOS Transistors
    Wood, J.
    Lamey, D.
    Guyonnet, M.
    Chan, D.
    Bridges, D.
    Monsauret, N.
    Aaen, P. H.
    2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4, 2008, : 605 - +
  • [23] A Nonlinear Electro-Thermal Model for High Power RF LDMOS Transistors
    Bridges, D.
    Wood, J.
    Guyonnet, M.
    Aaen, P. H.
    2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4, 2008, : 474 - 477
  • [24] Hot-Carrier Effects on Power RF LDMOS Device Reliability
    Belaid, M. A.
    Ketata, K.
    14TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATION OF ICS AND SYSTEMS, 2008, : 123 - 127
  • [25] Reliability study of power RF LDMOS device under thermal stress
    Belaid, M. A.
    Ketata, K.
    Mourgues, K.
    Gares, M.
    Masmoudi, M.
    Marcon, J.
    MICROELECTRONICS JOURNAL, 2007, 38 (02) : 164 - 170
  • [26] Optimization of LDMOS Power Transistors for High Power Microwave Amplifiers using Highly Efficient Physics-Based Model
    Everett, J. P.
    Kearney, M. J.
    Rueda, H. A.
    Johnson, E. M.
    Aaen, P. H.
    Wood, J.
    Snowden, C. M.
    2011 6TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE, 2011, : 41 - 44
  • [27] Modeling power VDMOSFET transistors: Device physics and equivalent circuit model with parameter extraction
    Vaid, R
    Padha, N
    Kumar, A
    Gupta, RS
    Parikh, CD
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 2004, 42 (10) : 775 - 782
  • [28] 2-D simulation and analysis of temperature effects on electrical parameters degradation of power RF LDMOS device
    Belaid, M. A.
    Ketata, K.
    Gares, M.
    Marcon, J.
    Mourgues, K.
    Masmoudi, M.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 253 (1-2): : 250 - 254
  • [29] Nonlinear modeling of LDMOS transistors for high-power FM transmitters
    Bosi, Gianni
    Crupi, Giovanni
    Vadala, Valeria
    Raffo, Antonio
    Giovannelli, Antonello
    Vannini, Giorgio
    INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2014, 27 (5-6) : 780 - 791
  • [30] Linearity analysis of RF LDMOS devices utilizing harmonic balance device simulation
    Tornblad, O
    Ito, CS
    Rotella, F
    Ma, G
    Dutton, RW
    SISPAD: 2005 International Conference on Simulation of Semiconductor Processes and Devices, 2005, : 243 - 246