The proton irradiation facility for Single-Event effect testing in CIAE

被引:0
|
作者
Zhang, Yan-Wen [1 ]
Guo, Gang
Liu, Jian-Cheng
Han, Jin-Hua
Qin, Ying-Can
Yin, Qian
Xiao, Shu-Yan
Yang, Xin-Yu
机构
[1] China Inst Atom Energy, Dept Nucl Phys, Beijing 102413, Peoples R China
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2022年 / 517卷
基金
中国国家自然科学基金;
关键词
Proton Irradiation Facility; Beam Measurement; Single-Event Effect; Proton Flux Detectors; FARADAY CUP; BEAM; DOSIMETRY;
D O I
10.1016/j.nimb.2022.02.008
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The proton radiation facility is built at an irradiation terminal of a 100-MeV cyclotron accelerator in the China Institute of Atomic Energy (CIAE). It is mainly used for testing the single-event effect of electronic devices. The part and function of the proton beamline for radiation effects research are introduced. Many detectors and techniques are used to accomplish accurate and reliable dosimetry and characterization of the proton beam. The results of beam characterization such as transmission, energy, lateral profile, and flux are reported. A typical monitoring and measuring system consist of a secondary electron emission monitor (SEM) working in a transmission mode and Faraday cup (FC). A cross-checking method of proton flux accuracy by FC and scintillation detector (SC) is established. The application of the reference single-event upset (SEU) monitor for the characterization of proton beams at different facilities is described. The SEU cross-section of the Reference SEU Monitor has confirmed the flux detection accuracy at CIAE.
引用
收藏
页码:43 / 48
页数:6
相关论文
共 50 条
  • [21] Proton-Induced Single-Event Degradation in SDRAMs
    Rodriguez, Axel
    Wrobel, Frederic
    Samaras, Anne
    Bezerra, Francoise
    Vandevelde, Benjamin
    Ecoffet, Robert
    Touboul, Antoine
    Chatry, Nathalie
    Dilillo, Luigi
    Saigne, Frederic
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 63 (04) : 2115 - 2121
  • [22] Automation of Laser Single-Event Effect Testing of Integrated Circuits for Space Missions
    Tsirkov, Artem N.
    Savchenkov, Dmitriy, V
    Novikov, Alexander A.
    Pechenkin, Alexander A.
    INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON 2021 ), 2021,
  • [23] The SIRAD irradiation facility for bulk damage and single event effect studies
    Bisello, D
    Candelori, A
    Giubilato, P
    Kaminski, A
    Pantano, D
    Rando, R
    Tessaro, A
    Wyss, J
    PROCEEDINGS OF THE 7TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2004, 536 : 451 - 455
  • [24] Analysis of Efficiency and Utilization with SRAM Dosimetry for Single-Event Effect Evaluation under Irradiation
    Woo, Seungjoo
    Yoon, Raehwan
    Bae, Dongwoo
    Kim, Kiseog
    Lee, Hyeokjae
    Chung, Sung S.
    Cho, Changhee
    Kim, Jeongsoo
    Wender, Stephen A.
    Kim, Youngboo
    2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS, 2022, : 170 - 175
  • [25] Investigation of proton single-event transient in CMOS image sensor
    Peng, Zhigang
    Fu, Yanjun
    Wei, Yuan
    Zuo, Yinghong
    Niu, Shengli
    Zhu, Jinhui
    Guo, Yaxin
    Liu, Fang
    Li, Pei
    He, Chaohui
    Li, Yonghong
    AIP ADVANCES, 2024, 14 (01)
  • [26] Effects of total dose irradiation on single-event upset hardness
    Schwank, J. R.
    Shaneyfelt, M. R.
    Felix, J. A.
    Dodd, P. E.
    Baggio, J.
    Ferlet-Cavrois, V.
    Paillet, P.
    Hash, G. L.
    Flores, R. S.
    Massengill, L. W.
    Blackmore, E.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (04) : 1772 - 1778
  • [27] BRAM Implementation of a Single-Event Upset Sensor for Adaptive Single-Event Effect Mitigation in Reconfigurable FPGAs
    Glein, Robert
    Mengs, Philipp
    Rittner, Florian
    Wansch, Rainer
    Heuberger, Albert
    2017 NASA/ESA CONFERENCE ON ADAPTIVE HARDWARE AND SYSTEMS (AHS), 2017, : 1 - 8
  • [28] Two Photon Absorption Laser Facility for Single Event Effect Testing
    Newton, Michael
    Danger, Brook
    Wang, Haibin
    Chen, Li
    Hiemstra, David M.
    Kirischian, Valeri
    2016 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2016, : 254 - 258
  • [29] Estimating the Effect of Single-event Upsets on Microprocessors
    Constantinescu, Cristian
    Krishnamoorthy, Srini
    Nguyen, Tuyen
    PROCEEDINGS OF THE 2014 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFTS), 2014, : 185 - 190
  • [30] Single-event effect ground test issues
    Aerospace Corp, El Segundo, United States
    IEEE Trans Nucl Sci, 2 pt 1 (661-670):