A combinned control chart to monitor small process mean

被引:0
|
作者
Liu, Na [1 ]
Zhou, Wenhui [1 ]
Wang, Zixuan [1 ]
机构
[1] South China Univ Technol, Sch Business Adm, Guangzhou, Guangdong, Peoples R China
关键词
quality control; combined chart; mean shift; Markov chain; SYNTHETIC CONTROL CHART;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This article proposes a new control chart, which has better performance in detecting small shifts. It combines np(chi) and CRL control chart, and the ring gage is used to classified conforming and nonconforming items. The combined chart employs attribute inspection which is easier to operate in monitoring. At the same time, the combined chart makes up for the shortcomings of the lack of accuracy of the attribute chart, it performs well when the mean shift is small.
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页数:4
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